The ezAFM+ is a compact atomic force microscope (AFM) offering flexible scanning options and easy integration with other systems, such as inverted optical microscopes or sample enclosures. Its interchangeable scan heads accommodate different scan ranges and resolutions, making it suitable for a wide variety of samples, including rough surfaces and thin materials such as graphene. The user-friendly design simplifies operation and maintenance, while its compact size allows for easy transport and storage. Equipped with multiple scanning modes, the ezAFM+ is a powerful tool for diverse surface analysis applications.