ATOMIC FORCE MICROSCOPE – NANOMAGNETICS INSTRUMENTS

Danh mục:
Xuất xứ: Anh
Thương hiệu:

The ezAFM+ is a compact atomic force microscope (AFM) offering flexible scanning options and easy integration with other systems, such as inverted optical microscopes or sample enclosures. Its interchangeable scan heads accommodate different scan ranges and resolutions, making it suitable for a wide variety of samples, including rough surfaces and thin materials such as graphene. The user-friendly design simplifies operation and maintenance, while its compact size allows for easy transport and storage. Equipped with multiple scanning modes, the ezAFM+ is a powerful tool for diverse surface analysis applications.

MODEL: ezAFM+

TECHNICAL SPECIFICATIONS

  • Compact atomic force microscopy system.
  • Two scan head options: 40 × 40 × 4 µm or 120 × 120 × 40 µm.
  • Can be integrated with an inverted optical microscope or operated inside a glovebox.
  • Controller footprint: only 15 × 15 cm.
  • Samples can be repositioned manually. Optional motorized or manual sample stages are available.
  • The manual XY positioner offers a travel range of 2 × 2 mm with a resolution of 10 µm. The motorized XY positioner offers a travel range of 38 × 38 mm with a resolution of 1 µm.
  • Available scanning modes:
    • Contact mode
    • Dynamic mode (tapping mode)
    • Lateral Force Microscopy (LFM)
    • Magnetic Force Microscopy (MFM)
    • Force–distance spectroscopy
    • Piezoresponse Force Microscopy (PFM)
    • Kelvin Probe Force Microscopy (KPFM)
    • Conductive AFM (C-AFM)
    • Scanning Spreading Resistance Microscopy (SSRM)
    • Lithography
    • Liquid mode

AQUA SCAN HEAD FOR LIQUID MODE (OPTIONAL)

Compatible with the inverted light microscope (ILM) module.

  • The ILM system consists of three components: the ezAFM scan head, an XY flexure stage, and an ezAFM–ILM adapter stage.
  • The XY flexure stage provides a 2 mm positioning range for the cantilever.
  • Coaxial illumination provides lighting from above the system. The cantilever and specimen can be viewed from the ILM using the camera integrated into the ezAFM.
  • The coarse Z-axis stage can be adjusted to accommodate thicker samples.

ROBUST AND FLEXIBLE

The ezAFM is designed for easy, safe, and frequent scan head replacement. Each system can accommodate different scan heads to suit various scan sizes, Z ranges, and operating environments, including air and liquid.

EASY TO USE

Cantilever replacement is straightforward, using a range of commercially available cantilevers with alignment grooves on the back of the chip.

Specially designed alignment chips are incorporated into the scan head, ensuring that each installed cantilever occupies precisely the same position relative to the laser beam. This eliminates the need to realign the laser or photodiode.

COMPACT AND PORTABLE

With a footprint of just 70 × 30 cm, the ezAFM requires very little operating space.

The lightweight system comes with a rugged Pelican carrying case for convenient transport and storage. The microscope can also be placed inside a glovebox for applications requiring more stringent environmental control.

VERSATILE

Two scan heads are available to accommodate a wide range of operating requirements.

  • The ezAFM120 scan head offers a maximum XYZ scan range of 120 × 120 × 40 µm and a Z resolution of 0.2 nm, making it particularly suitable for samples with rough surfaces.
  • The ezAFM40 scan head offers a maximum XYZ scan range of 40 × 40 × 4 µm and a Z resolution of 0.02 nm, enabling scanning of surfaces such as monolayer graphene.

LIÊN HỆ VỚI CHÚNG TÔI

Liên hệ với chúng tôi để nhận bản tin về các sản phẩm mới, mã khuyến mại nhanh nhất.

LIÊN HỆ NGAY

Quyền lợi của khách hàng